Description

Key benefits

• Faster sample characterization: Benefit from a novel approach to sample navigation and acquisition of multimodal analytical STEM datasets without the need for lengthy microscope alignments and data acquisition optimization.
• Routine 4D-STEM analysis: Enhance sample characterization by seamless 4D-STEM workflows made as easy as EDX elemental mapping.
• Higher accuracy and precision: Improve sample characterization with precession-assisted 4D-STEM for accurate strain analysis and phase-orientation mapping.
• Consistent results: Reduce operator variability through fully automated column alignments and guided workflows, ensuring reproducibility across shifts and sites.
• Faster decision-making: Accelerate analysis with on-the-fly processing of acquired 4D-STEM data to provide meaningful and interpretable results interactively during sample analysis.