High Resolution at Low Voltage

BrightBeam™ optics deliver field-free surface-sensitive imaging even below 1 keV, making them ideal for use with beam-sensitive, non-conductive, or magnetic samples.

Rich Contrast Selection

CLARA^™‘s in-column Multidetector and Axial detector capture topographic and material contrasts in a single scan. Energy-filtered BSE isolates surface-level material contrast, enhancing visibility of composition. Angular BSE filtering reveals contrast differences based on take-off angle. This multimodal setup provides deeper insight into complex or layered materials.

Automation That Works for You

In-Flight™ Automated controls handle beam centering, focusing, and contrast optimization, reducing the number of manual steps required and improving consistency across sessions.

Correlative Imaging, Simplified

Combine SEM with Raman (Tescan RISE) or Serial Block Face Imaging (SBFI) for integrated spectral and structural analysis without transferring your sample.

Built for Flexibility

CLARA^™‘s adaptable, user-friendly software GUI makes it easy for everyone to operate. Options like no-code workflow building, open scripting with full control, and a flexible, large analytical chamber make it a solution that can be adapted to emerging needs. It’s an ideal solution for both industrial R&D and research laboratories.