Automated Ga⁺ FIB-SEM for high-precision TEM sample prep and nanoscale prototyping

Tescan AMBER^™ 2 gives you BrightBeam™ field-free SEM optics, the Orage™ Ga⁺ FIB, and fully automated lamella workflows for consistent, high-quality TEM sample preparation. Perform inverted and planar sample prep, nanoprocessing, and gentle final polishing across a wide range of materials.